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    Каталог BS — национальные стандарты Великобритании

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    найдено документов: 43921 страниц: 2197

    BS EN 60749-27:2006+A1:2012

    Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

    Количество страниц: 16 Статус:  

    BS EN 60749-28:2017

    Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

    Количество страниц: 50 Статус:  

    BS EN 60749-29:2011

    Semiconductor devices. Mechanical and climatic test methods. Latch-up test

    Количество страниц: 26 Статус:  

    BS EN 60749-31:2003

    Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (internally induced)

    Количество страниц: 8 Статус:  

    BS EN 60749-32:2003+A1:2010

    Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)

    Количество страниц: 8 Статус:  

    BS EN 60749-33:2004

    Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased autoclave

    Количество страниц: 10 Статус:  

    BS EN 60749-34:2010

    Semiconductor devices. Mechanical and climatic test methods. Power cycling

    Количество страниц: 14 Статус:  

    BS EN 60749-35:2006

    Semiconductor devices. Mechanical and climatic test methods. Acoustic microscopy for plastic encapsulated electronic components

    Количество страниц: 24 Статус:  

    BS EN 60749-36:2003

    Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state

    Количество страниц: 8 Статус:  

    BS EN 60749-37:2008

    Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer

    Количество страниц: 22 Статус:  

    BS EN 60749-38:2008

    Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory

    Количество страниц: 16 Статус:  

    BS EN 60749-39:2006

    Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

    Количество страниц: 12 Статус:  

    BS EN 60749-40:2011

    Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge

    Количество страниц: 26 Статус:  

    BS EN 60749-42:2014

    Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage

    Количество страниц: 12 Статус:  

    BS EN 60749-43:2017

    Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans

    Количество страниц: 44 Статус:  

    BS EN 60749-44:2016

    Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

    Количество страниц: 26 Статус:  

    BS EN 60751:2008

    Industrial platinum resistance thermometers and platinum temperature sensors

    Количество страниц: 28 Статус:  

    BS EN 60754-1:2014

    Test on gases evolved during combustion of materials from cables. Determination of the halogen acid gas content

    Количество страниц: 26 Статус:  

    BS EN 60754-1:2014+A1:2020

    Test on gases evolved during combustion of materials from cables. Determination of the halogen acid gas content

    Количество страниц: 26 Статус:  

    BS EN 60754-2:2014

    Test on gases evolved during combustion of materials from cables. Determination of acidity (by pH measurement) and conductivity

    Количество страниц: 24 Статус:  

    найдено документов: 43921 страниц: 2197


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