Каталог BS — национальные стандарты Великобритании
найдено документов: 43921 страниц: 2197
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods. Low air pressureКоличество страниц: 10 Статус:
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods. External visual examinationКоличество страниц: 18 Статус:
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods. Storage at high temperatureКоличество страниц: 12 Статус:
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods. SealingКоличество страниц: 20 Статус:
BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods. Permanence of markingКоличество страниц: 14 Статус:
BS EN 60749-10:2002
Semiconductor devices. Mechanical and climatic test methods. Mechanical shockКоличество страниц: 8 Статус:
BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Particle impact noise detection (PIND)Количество страниц: 10 Статус:
BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods. Die shear strengthКоличество страниц: 10 Статус:
BS EN 60749-21:2011
Semiconductor devices. Mechanical and climatic test methods. SolderabilityКоличество страниц: 26 Статус:
BS EN 60749-22:2003
Semiconductor devices. Mechanical and climatic test methods. Bond strengthКоличество страниц: 24 Статус:
BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods. High temperature operating lifeКоличество страниц: 12 Статус:
BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods. Temperature cyclingКоличество страниц: 16 Статус:
найдено документов: 43921 страниц: 2197